Accurate broadband modeling of multiconductor line RLGC-parameters in the presence of good conductors and semiconducting substrates

Author

De Zutter, Daniel

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium

Volume

3

Issue

2

fYear

2014

fDate

2nd Quarter 2014

Firstpage

76

Lastpage

84

Abstract

This tutorial discusses the definition and the meaning of the classical resistance-inductance-conductance-capacitance (RLGC-) parameters for multiconductor transmission lines in the presence of good conductors and semiconductors. Special attention is devoted to the correct circuit interpretation of voltages and currents. An efficient numerical approach to obtain broadband RLGC-data for arbitrary cross-sections, while accurately taking into account skin-effect and current crowding, is outlined. Three examples illustrate the proposed approach: a printed circuit board (PCB) differential line, a metal-insulator-semiconductor (MIS) microstrip and a pair of coupled inverted embedded on-chip lines.

Keywords

MIS devices; conductors (electric); coupled circuits; microstrip lines; multiconductor transmission lines; printed circuits; MIS microstrip; PCB; arbitrary cross-sections; broadband RLGC-data; broadband modeling; circuit interpretation; classical resistance-inductance-conductance-capacitance; conductors; coupled inverted embedded on-chip lines; current crowding; differential line; metal-insulator-semiconductor microstrip; multiconductor line RLGC-parameters; multiconductor transmission lines; printed circuit board; semiconducting substrates; skin-effect; Broadband communication; Capacitance; Conductors; Integrated circuits; Microstrip; Multiconductor transmission lines; Printed circuits; Proximity effects; Resistance; Semiconductor device measurement; Tutorials;

fLanguage

English

Journal_Title

Electromagnetic Compatibility Magazine, IEEE

Publisher

ieee

ISSN

2162-2264

Type

jour

DOI

10.1109/MEMC.2014.6849550

Filename

6849550