• DocumentCode
    824018
  • Title

    Steady State Gamma Testing of a 4K NMOS Dynamic Ram

  • Author

    Coleman, D.W. ; Temkin, B.M.

  • Author_Institution
    General Dynamics Electronics Division Post Office Box 2566 Orlando, Florida 32802
  • Volume
    23
  • Issue
    3
  • fYear
    1976
  • fDate
    6/1/1976 12:00:00 AM
  • Firstpage
    1301
  • Lastpage
    1303
  • Keywords
    DRAM chips; Electronic equipment testing; Instruments; Ionizing radiation; MOS devices; Random access memory; Read-write memory; Satellites; Sequential analysis; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1976.4328456
  • Filename
    4328456
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=824018