DocumentCode :
824219
Title :
An efficient two-dimensional graded mesh finite-difference time-domain algorithm for shielded or open waveguide structures
Author :
Brankovic, Veselin J. ; Krupezevic, Dragan V. ; Arndt, F.
Author_Institution :
Microwave Dept., Bremen Univ., Germany
Volume :
40
Issue :
12
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
2272
Lastpage :
2277
Abstract :
A finite-difference-time-domain (FDTD) algorithm for the efficient full-wave analysis of a comprehensive class of millimeter-wave and optical waveguide structures is described. The algorithm is based on a two-dimensional graded mesh combined with adequately formulated absorbing boundary conditions. This allows the inclusion of nearly arbitrarily shaped, fully or partially lateral open or shielded guiding structures with or without layers of finite metallization thickness. Moreover, lossy dielectrics and/or lossy conductors are included in the theory. The algorithm leads to a significant reduction in CPU time and storage requirements as compared with the conventional three-dimensional eigenvalue FDTD mesh formulation. Dispersion characteristic examples are calculated for structures suitable for usual integrated circuits, such as insulated image guides, ridge guides, dielectric waveguides, trapped image guides, coplanar-lines and microstrip lines. The theory is verified by comparison with results obtained by other methods
Keywords :
boundary-value problems; electronic engineering computing; finite difference time-domain analysis; optical waveguide theory; waveguide theory; CPU time; FDTD algorithm; absorbing boundary conditions; coplanar-lines; dielectric waveguides; finite metallization thickness; full-wave analysis; insulated image guides; lossy conductors; lossy dielectrics; microstrip lines; millimeter-wave; open waveguide structures; optical waveguide; ridge guides; shielded guiding structures; trapped image guides; two-dimensional graded mesh finite-difference time-domain; Algorithm design and analysis; Boundary conditions; Conductors; Dielectric losses; Finite difference methods; Metallization; Millimeter wave technology; Optical losses; Optical waveguides; Time domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.179890
Filename :
179890
Link To Document :
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