DocumentCode :
82431
Title :
A 0.5-V 5.2-fJ/Conversion-Step Full Asynchronous SAR ADC With Leakage Power Reduction Down to 650 pW by Boosted Self-Power Gating in 40-nm CMOS
Author :
Sekimoto, Ryota ; Shikata, Akira ; Yoshioka, Kazuaki ; Kuroda, Tadahiro ; Ishikuro, Hiroki
Author_Institution :
Keio Ishikuro Lab., Yokohama, Japan
Volume :
48
Issue :
11
fYear :
2013
fDate :
Nov. 2013
Firstpage :
2628
Lastpage :
2636
Abstract :
This paper presents an ultralow-power and ultralow-voltage SAR ADC. Full asynchronous operation and boosted self-power gating are proposed to improve conversion accuracy and reduce static leakage power. By designing with MOSFET of high threshold voltage (HVt) and low threshold voltage (LVt), the leakage power is reduced without decrease of maximum sampling frequency. The test chip in 40-nm CMOS process has successfully reduced leakage power by 98%, and it achieves 8.2-bit ENOB and while consuming only 650 pW at 0.1 kS/s from 0.5-V power supply. The power consumption is scalable up to 4 MS/s and power supply range from 0.4 to 0.7 V. The best figure of merit at 0.5 V is 5.2 fJ/conversion-step at 20 kS/s.
Keywords :
CMOS integrated circuits; analogue-digital conversion; asynchronous circuits; low-power electronics; CMOS; boosted self-power gating; conversion accuracy; full asynchronous SAR ADC; leakage power reduction; power 650 pW; power consumption; size 40 nm; static leakage power; ultralow-power SAR ADC; ultralow-voltage SAR ADC; voltage 0.4 V to 0.7 V; word length 8.2 bit; CMOS integrated circuits; Clocks; Delays; Leakage currents; MOSFET; Power demand; Switches; Asynchronous; data converter; leakage power; low-power; low-voltage; power gating; successive-approximation-register (SAR) ADC;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2013.2274851
Filename :
6578607
Link To Document :
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