Title :
Modeling, design and characterization of a new low-jitter analog dual tuning LC-VCO PLL architecture
Author :
Nonis, Roberto ; Dalt, Nicola Da ; Palestri, Pierpaolo ; Selmi, Luca
Author_Institution :
Univ. of Udine, Italy
fDate :
6/1/2005 12:00:00 AM
Abstract :
This paper describes the modeling, design, and characterization of a low-jitter 2.4-GHz LC-VCO PLL architecture realized in a standard 0.12-μm CMOS technology. It features an analog dual control loop for fine and coarse VCO tuning that allows very low VCO gain (60 MHz/V) for noise rejection while maintaining a wide tuning range. The coarse input of the VCO is driven by an analog circuit that adjusts the VCO gain in a continuous manner. Measurements demonstrate an integrated jitter of 0.74 ps that is 43% lower compared to results from a standard PLL topology (STD PLL) with a single control loop. The PLLs have the same bandwidth and output frequency range and were built on the same wafer for comparison. The circuit area of the proposed LC-VCO PLL is 0.7 mm2 and the power consumption is 32 mW. The area and power consumption of the proposed LC-VCO PLL are less than 1% larger compared to the STD PLL.
Keywords :
CMOS analogue integrated circuits; UHF integrated circuits; UHF oscillators; circuit tuning; jitter; phase locked loops; phase noise; switched capacitor networks; voltage-controlled oscillators; 0.12 micron; 2.4 GHz; 32 mW; LC-VCO PLL architecture; analog dual control loop; clock generator; low-jitter analog dual tuning; noise rejection; phase noise; single control loop; standard PLL topology; voltage controlled oscillator gain; voltage controlled oscillator tuning; Analog circuits; CMOS technology; Circuit optimization; Energy consumption; Integrated circuit measurements; Jitter; Measurement standards; Phase locked loops; Semiconductor device modeling; Voltage-controlled oscillators; Clock generator; clocking; jitter; mixed-mode; phase noise; phase-locked loop (PLL); voltage-controlled oscillator (VCO);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2005.848037