• DocumentCode
    824510
  • Title

    Design and characterization of high performance 60 GHz pseudomorphic MODFET LNAs in CPW-technology based on accurate S-parameter and noise models

  • Author

    Schlechtweg, Michael ; Reinert, Werner ; Tasker, Paul J. ; Bosch, Roland ; Braunstein, Jürgen ; Hülsmann, Axel ; Köhler, Klaus

  • Author_Institution
    Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany
  • Volume
    40
  • Issue
    12
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    2445
  • Lastpage
    2451
  • Abstract
    An accurate database for active and passive MMIC components valid up to millimeter-wave frequencies has been established. The CAE models for the transistors and the passive CPW-components; which include the coplanar T-junction, are derived from on-wafer S-parameter measurements up to 63 GHz. For noise modeling of the MODFETs up to millimeter-wave frequencies, an approach based on the temperature noise model reported by M.W. Pospiezalski (1989) has been used. The parameter Td, which is required for the temperature model, is extracted from on-wafer noise parameter measurements up to 18 GHz. Using this database, the authors have designed and fabricated low-noise V -band two-stage amplifiers, using pseudomorphic MODFETs on a GaAs substrate, which have a performance of 10.5-dB gain and 5.2-dB noise figure at 58.5 GHz. Very good agreement between simulated and measured MMIC gain and noise performance is achieved up to V-band
  • Keywords
    MMIC; S-parameters; equivalent circuits; field effect integrated circuits; high electron mobility transistors; integrated circuit testing; microwave amplifiers; microwave measurement; semiconductor device models; semiconductor device noise; 10.5 dB; 5.2 dB; 58.5 to 60 GHz; CAE models; CPW-technology; EHF; GaAs substrate; LNAs; MIMIC; MM-wave monolithic IC; S-parameter model; V-band; active MMIC components; coplanar T-junction; database; low-noise; millimeter-wave frequencies; noise models; on-wafer S-parameter measurements; passive CPW-components; pseudomorphic MODFET; temperature noise model; transistors; two-stage amplifiers; Databases; Frequency; HEMTs; MMICs; MODFETs; Millimeter wave measurements; Millimeter wave transistors; Noise measurement; Performance gain; Temperature;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.179915
  • Filename
    179915