DocumentCode
824510
Title
Design and characterization of high performance 60 GHz pseudomorphic MODFET LNAs in CPW-technology based on accurate S -parameter and noise models
Author
Schlechtweg, Michael ; Reinert, Werner ; Tasker, Paul J. ; Bosch, Roland ; Braunstein, Jürgen ; Hülsmann, Axel ; Köhler, Klaus
Author_Institution
Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany
Volume
40
Issue
12
fYear
1992
fDate
12/1/1992 12:00:00 AM
Firstpage
2445
Lastpage
2451
Abstract
An accurate database for active and passive MMIC components valid up to millimeter-wave frequencies has been established. The CAE models for the transistors and the passive CPW-components; which include the coplanar T-junction, are derived from on-wafer S -parameter measurements up to 63 GHz. For noise modeling of the MODFETs up to millimeter-wave frequencies, an approach based on the temperature noise model reported by M.W. Pospiezalski (1989) has been used. The parameter T d, which is required for the temperature model, is extracted from on-wafer noise parameter measurements up to 18 GHz. Using this database, the authors have designed and fabricated low-noise V -band two-stage amplifiers, using pseudomorphic MODFETs on a GaAs substrate, which have a performance of 10.5-dB gain and 5.2-dB noise figure at 58.5 GHz. Very good agreement between simulated and measured MMIC gain and noise performance is achieved up to V -band
Keywords
MMIC; S-parameters; equivalent circuits; field effect integrated circuits; high electron mobility transistors; integrated circuit testing; microwave amplifiers; microwave measurement; semiconductor device models; semiconductor device noise; 10.5 dB; 5.2 dB; 58.5 to 60 GHz; CAE models; CPW-technology; EHF; GaAs substrate; LNAs; MIMIC; MM-wave monolithic IC; S-parameter model; V-band; active MMIC components; coplanar T-junction; database; low-noise; millimeter-wave frequencies; noise models; on-wafer S-parameter measurements; passive CPW-components; pseudomorphic MODFET; temperature noise model; transistors; two-stage amplifiers; Databases; Frequency; HEMTs; MMICs; MODFETs; Millimeter wave measurements; Millimeter wave transistors; Noise measurement; Performance gain; Temperature;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.179915
Filename
179915
Link To Document