Title :
ZoneDefense: A Fault-Tolerant Routing for 2-D Meshes Without Virtual Channels
Author :
Binzhang Fu ; Yinhe Han ; Huawei Li ; Xiaowei Li
Author_Institution :
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
Abstract :
Fault-tolerant routing is usually used to provide reliable on-chip communication for many-core processors. This paper focuses on a special class of algorithms that do not use virtual channels. One of the major challenges is to keep the network deadlock free in the presence of faults, especially those locating on network edges. State-of-the-art solutions address this problem by either disabling all nodes of the faulty network edges or including all faults into one faulty block. Therefore, a large number of fault-free nodes will be sacrificed. To address this problem, the proposed ZoneDefense routing not only includes faults into convex faulty blocks but also spreads the faulty blocks´ position information in corresponding columns. The nodes, which know the position of faulty blocks, form the defense zones. Therefore, packets can find the faulty blocks and route around them in advance. Exploiting the defense zones, the proposed ZoneDefense routing could tolerate many more faults with significantly reduced sacrificed fault-free nodes compared with the state-of-the-art algorithms. Furthermore, the ZoneDefense routing does not degrade the network performance in the absence of faults, and could get similar performance as its counterparts in the presence of faults.
Keywords :
failure analysis; network routing; network-on-chip; 2D mesh; NoC; ZoneDefense routing; convex faulty blocks; fault-free nodes; fault-tolerant routing; faulty block position; faulty network edges; many-core processors; on-chip communication reliability; Algorithm design and analysis; Clocks; Fault tolerance; Fault tolerant systems; Registers; Routing; System recovery; Fault-tolerant routing; mesh; network-on-chip (NoC); reconfigurable router; turn model;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2012.2235188