DocumentCode
824588
Title
Generic linear RC delay modeling for digital CMOS circuits
Author
Deng, An-Chang ; Shiau, Yan-Chyuan
Author_Institution
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Volume
9
Issue
4
fYear
1990
fDate
4/1/1990 12:00:00 AM
Firstpage
367
Lastpage
376
Abstract
The linear RC delay modeling technique is used to model the timing delays in CMOS circuit empirically. The empirical model, a multidimensional function of various circuit and device parameters, is shown to be simplified to a two-dimensional model which estimates the delay of a CMOS subcircuit in terms of the generic RC delay ad the rise/fall time of the input transition. Accuracy limitations of the linear RC delay model are investigated; namely, (i) the single-time-constant approximation on the multiple-pole network function; (ii) the linear resistance approximation on the nonlinear MOSFET characteristic; and (iii) the step-input waveform assumption. These accuracy problems are handled by: (1) presenting an accuracy measure of the simpler model and an option for using the more accurate two-time-constant model; (2) exploiting the nonlinear body effect in the transmission gate to improve the linear resistance characterization; and (3) using the piecewise-linear characterization on the input rise/fall time effect. The model has been installed in an experimental simulator and tested for various circuits. Comparisons are made with SPICE to validate the model reliability
Keywords
CMOS integrated circuits; circuit analysis computing; delays; digital integrated circuits; semiconductor device models; accuracy measure; accuracy problems; digital CMOS circuits; empirical model; experimental simulator; input rise/fall time effect; input transition; linear RC delay modeling; linear resistance approximation; multidimensional function; multiple-pole network function; nonlinear MOSFET characteristic; nonlinear body effect; piecewise-linear characterization; single-time-constant approximation; step-input waveform assumption; timing delays; two-dimensional model; two-time-constant model; Circuit testing; Delay effects; Delay estimation; Immune system; Linear approximation; Multidimensional systems; Propagation delay; Semiconductor device modeling; Timing; Transfer functions;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.45868
Filename
45868
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