DocumentCode
824694
Title
Charge Yield and Dose Effects in MOS Capacitors at 80 K
Author
Boesch, H.E., Jr. ; McGarrity, J.M.
Author_Institution
Harry Diamond Laboratories Adelphi, Maryland 20783
Volume
23
Issue
6
fYear
1976
Firstpage
1520
Lastpage
1525
Keywords
Capacitance-voltage characteristics; Charge measurement; Current measurement; DNA; Electric variables measurement; Ionizing radiation; Linear particle accelerator; MOS capacitors; Pulse measurements; Temperature;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1976.4328532
Filename
4328532
Link To Document