Title :
Designing cathode ray tubes using probabilistic techniques
Author :
Ghosh, Asish ; Cha, Chin Y. ; Vaidyanathan, Shridhar
Author_Institution :
Philips Display Components Co., Ann Arbor, MI, USA
fDate :
11/1/1992 12:00:00 AM
Abstract :
A step-by-step procedure to design and analyze the structural reliability, optical performance, and manufacturability of CRTs is proposed. It is suggested that for performance parameters where a deterministic approach cannot be used, a probabilistic approach should be used. The use of the probabilistic method to analyze the structural integrity of a CRT is shown. Results of the stresses in a CRT, along with the probability of failures due to vacuum and the application of an implosion protection hand, are discussed for a 68-cm (27-in) diagonal CRT
Keywords :
cathode-ray tubes; design engineering; probability; reliability; 68 cm; CRT; cathode ray tubes; design techniques; implosion protection hand; manufacturability; optical performance; performance parameters; probabilistic techniques; step-by-step procedure; stresses; structural reliability; vacuum; Assembly; Cathode ray tubes; Displays; Failure analysis; Finite element methods; Geometry; Glass; Manufacturing processes; Protection; Thermal stresses;
Journal_Title :
Consumer Electronics, IEEE Transactions on
