Title :
Second generation 50 K dual-mode sapphire oscillator
Author :
Anstie, J.D. ; Hartnett, John ; Tobar, M.E. ; Ivanov, E.N. ; Stanwix, Paul L.
Author_Institution :
Stand. & Metrology Group, Western Australia Univ., Nedlands, WA, Australia
Abstract :
Low-temperature, high-precision sapphire resonators exhibit a turning point in mode frequency-temperature dependence at around 10 K. This, along with sapphire´s extremely low dielectric losses at microwave frequencies, results in oscillator fractional frequency stabilities on the order of 10/sup -15/. At higher temperatures the lack of a turning point makes single-mode oscillators very sensitive to temperature fluctuations. By exciting two quasi-orthogonal whispering gallery (WG) modes in a single sapphire resonator, a turning point in the frequency-temperature dependence can be found in the beat frequency between the two modes. A temperature control technique based on mode frequency-temperature dependence has been used to maintain the sapphire at this turning point and the fractional frequency instability of the beat frequency has been measured to be at a level of 4.3 /spl times/ 10/sup -14/ over 1 s, dropping to 3.5 /spl times/ 10/sup -14/ over 4 s integration time.
Keywords :
dielectric resonator oscillators; sapphire; temperature control; whispering gallery modes; 50 K; Al/sub 2/O/sub 3/; dual-mode sapphire oscillator; fractional frequency instability; mode frequency-temperature dependence; oscillator fractional frequency stability; quasiorthogonal whispering gallery modes; second generation; single-mode oscillators; temperature control technique; temperature fluctuations; Dielectric losses; Fluctuations; Frequency measurement; Microwave frequencies; Microwave oscillators; Stability; Temperature control; Temperature sensors; Time measurement; Turning;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2006.1593366