• DocumentCode
    825522
  • Title

    Heterojunction interfacial workfunction internal photoemission detectors for use at 8-20 μm

  • Author

    Rinzan, M.B.M. ; Matsik, S.G. ; Esaev, D.G. ; Perera, A.G.U. ; Liu, H.C. ; Buchanan, M. ; Wasilevski, Z.

  • Author_Institution
    Dept. of Phys. & Astron., Georgia State Univ., Atlanta, GA, USA
  • Volume
    150
  • Issue
    4
  • fYear
    2003
  • Firstpage
    385
  • Lastpage
    389
  • Abstract
    Heterojunction interfacial workfunction internal photoemission (HEIWIP) detectors have already been demonstrated for use in the FIR range with cutoff wavelengths λc up to 85 μm. An interesting feature of these detectors is their strong response in the 8-20 μm range. Initial results are reported on HEIWIP detectors operating in the 8-20 μm range. The unoptimised detectors had a peak responsivity of 1.8 A/W at 15.2 μm at 4.2 K. HEIWIPs could be an alternative to already available detectors especially when optimised for higher temperatures. λc can be tailored by changing the Al concentration in the barrier. Responsivity of HEIWIPs can be selectively optimised by using the cavity mechanism and adjusting the Al fraction. It should also be possible to enhance the responsivity by changing the doping concentrations of the detectors.
  • Keywords
    aluminium; doping profiles; infrared detectors; infrared spectra; photodetectors; photoemission; semiconductor doping; semiconductor heterojunctions; work function; 4.2 K; 8 to 20 mum; Al; FIR range; doping concentration; heterojunction interfacial workfunction internal photoemission detectors; peak responsivity;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:20030788
  • Filename
    1245001