DocumentCode :
825522
Title :
Heterojunction interfacial workfunction internal photoemission detectors for use at 8-20 μm
Author :
Rinzan, M.B.M. ; Matsik, S.G. ; Esaev, D.G. ; Perera, A.G.U. ; Liu, H.C. ; Buchanan, M. ; Wasilevski, Z.
Author_Institution :
Dept. of Phys. & Astron., Georgia State Univ., Atlanta, GA, USA
Volume :
150
Issue :
4
fYear :
2003
Firstpage :
385
Lastpage :
389
Abstract :
Heterojunction interfacial workfunction internal photoemission (HEIWIP) detectors have already been demonstrated for use in the FIR range with cutoff wavelengths λc up to 85 μm. An interesting feature of these detectors is their strong response in the 8-20 μm range. Initial results are reported on HEIWIP detectors operating in the 8-20 μm range. The unoptimised detectors had a peak responsivity of 1.8 A/W at 15.2 μm at 4.2 K. HEIWIPs could be an alternative to already available detectors especially when optimised for higher temperatures. λc can be tailored by changing the Al concentration in the barrier. Responsivity of HEIWIPs can be selectively optimised by using the cavity mechanism and adjusting the Al fraction. It should also be possible to enhance the responsivity by changing the doping concentrations of the detectors.
Keywords :
aluminium; doping profiles; infrared detectors; infrared spectra; photodetectors; photoemission; semiconductor doping; semiconductor heterojunctions; work function; 4.2 K; 8 to 20 mum; Al; FIR range; doping concentration; heterojunction interfacial workfunction internal photoemission detectors; peak responsivity;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2433
Type :
jour
DOI :
10.1049/ip-opt:20030788
Filename :
1245001
Link To Document :
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