• DocumentCode
    825543
  • Title

    Ternary and quaternary alloy III-V antimonide (InAsSb and InAsSbP) virtual substrates made by liquid-phase epitaxy

  • Author

    Mauk, M.G. ; Tata, A.N. ; Cox, J.A. ; Sulima, O.V. ; Datta, S.

  • Author_Institution
    AstroPower Inc., Newark, DE, USA
  • Volume
    150
  • Issue
    4
  • fYear
    2003
  • Firstpage
    395
  • Lastpage
    398
  • Abstract
    Thick (>100 μm) epitaxial layers of ternary and quaternary alloy III-V antimonides (e.g. InAsSb, InGaSb, AlGaAsSb, InGaAsSb and InAsSbP) can function as ´virtual´ substrates for mid-infrared optoelectronics applications. Such alloy substrates have adjustable lattice constants and bandgaps, and are therefore of considerable interest for epitaxial growth of lattice-matched or strain-engineered epitaxial device structures, including mid-infrared detectors and light-emitting diodes. Liquid-phase epitaxy (LPE) methods can be readily adapted for the growth of such III-V antimonide virtual substrates due to the fast growth rates (1 to 10 μm/min) that are achievable with III-V antimonide LPE. The authors report on the development of InAsSb and InAsSbP virtual substrates consisting of two or three thick compositionally step-graded epitaxial layers grown by LPE on InAs substrates. Through this approach, ternary and quaternary alloy virtual substrates are obtained, with lattice constants and bandgaps significantly different from those currently available with binary compound substrates, including virtual substrates with optical absorption edges in the 4-5 μm wavelength range.
  • Keywords
    III-V semiconductors; energy gap; indium compounds; infrared spectra; lattice constants; liquid phase epitaxial growth; semiconductor epitaxial layers; semiconductor growth; substrates; ternary semiconductors; III-V antimonide; InAs; InAsSb; InAsSb virtual substrates; InAsSbP; InAsSbP virtual substrates; adjustable lattice constants; alloy substrates; bandgaps; binary compound substrates; epitaxial growth; lattice-matched epitaxial device structures; light-emitting diodes; liquid-phase epitaxy; liquid-phase epitaxy methods; midinfrared detectors; midinfrared optoelectronics applications; optical absorption edges; quaternary alloy; step-graded epitaxial layers; strain-engineered epitaxial device structures; ternary alloy; thick epitaxial layers;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:20030538
  • Filename
    1245005