DocumentCode
825584
Title
Irradiated Electronics Reliability Study
Author
Ashley, Chris ; Deve, Bernd
Author_Institution
Air Force Weapons Laboratory Kirtland Air Force Base Albuquerque, New Mexico
Volume
23
Issue
6
fYear
1976
Firstpage
2031
Lastpage
2034
Keywords
Aerospace electronics; Circuit testing; Control systems; Degradation; Electronic equipment testing; Force control; Hardware; Laboratories; System testing; Weapons;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1976.4328619
Filename
4328619
Link To Document