DocumentCode :
825841
Title :
Noncontact Probes for Wire FaultLocation With Reflectometry
Author :
Wu, Shang ; Furse, Cynthia ; Lo, Chet
Author_Institution :
Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT
Volume :
6
Issue :
6
fYear :
2006
Firstpage :
1716
Lastpage :
1721
Abstract :
This paper describes an approach to locate wire faults using reflectometry without physical contact with the wire conductor. This noncontact method is capable of locating faults on both dead and live powered wires with today´s reflectometry technologies, and it does not require any modification or disconnection of the existing wiring system. With proper configuration, this method can detect wire faults with an accuracy of 3 in, which is comparable to direct connection systems
Keywords :
avionics; fault location; reflectometry; wires (electric); noncontact probes; reflectometry technology; wire fault location; Aging; Circuit faults; Cities and towns; Conductors; Fault location; Probes; Reflectometry; Testing; Wire; Wiring; Capacitive coupling; inductive coupling; reflectometry; wire fault location;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2006.884560
Filename :
4014199
Link To Document :
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