• DocumentCode
    825841
  • Title

    Noncontact Probes for Wire FaultLocation With Reflectometry

  • Author

    Wu, Shang ; Furse, Cynthia ; Lo, Chet

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT
  • Volume
    6
  • Issue
    6
  • fYear
    2006
  • Firstpage
    1716
  • Lastpage
    1721
  • Abstract
    This paper describes an approach to locate wire faults using reflectometry without physical contact with the wire conductor. This noncontact method is capable of locating faults on both dead and live powered wires with today´s reflectometry technologies, and it does not require any modification or disconnection of the existing wiring system. With proper configuration, this method can detect wire faults with an accuracy of 3 in, which is comparable to direct connection systems
  • Keywords
    avionics; fault location; reflectometry; wires (electric); noncontact probes; reflectometry technology; wire fault location; Aging; Circuit faults; Cities and towns; Conductors; Fault location; Probes; Reflectometry; Testing; Wire; Wiring; Capacitive coupling; inductive coupling; reflectometry; wire fault location;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2006.884560
  • Filename
    4014199
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=825841