• DocumentCode
    825890
  • Title

    Time Resolution in Semi-Conductor Detectors

  • Author

    El-Wahab, N.A. ; Sakka, M.

  • Author_Institution
    Alexandria University, Egypt
  • Volume
    24
  • Issue
    1
  • fYear
    1977
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    An analytical expression for the prompt time response is compared with available data of prompt cures using surface-barrier detectors, yielding a relation for T¿ = 0.33 ¿1/¿n = 0.40 ¿2 ¿n/N where ¿1, ¿2 rise and decay times of single-electron response, n/N is the optimum value at minimum time resolution. A preliminary method is proposed for computing the plasma time in these detectors.
  • Keywords
    Capacitance; Charge carrier processes; Conductivity; Detectors; Electrodes; Energy loss; Ice; Ionization; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1977.4328652
  • Filename
    4328652
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=825890