Title :
Equipment Throughput Optimization by Means of Speed Loss Analysis
Author :
Foster, Jason ; Matthews, John ; Beaumont, Preston ; Zarbock, Thomas ; Yeo, Danny
Author_Institution :
Qimonda AG, Sandston, VA
Abstract :
Consistent with the semiconductor industry´s focus on continuous improvement, increased throughput, and shorter cycle times, this paper describes a methodology for the qualification and quantification of speed loss at a toolset level. The identification and quantification of the speed loss categories, along with implementation of specific actions targeted at these losses, has enabled our fab to have a direct impact on overall capacity and throughput performance of our toolsets.
Keywords :
semiconductor device manufacture; equipment throughput optimization; speed loss analysis; toolset level; Availability; Continuous improvement; Helium; Lithography; Performance loss; Qualifications; Steady-state; Throughput; Time measurement; Velocity measurement; Cascade; cascade train; overall equipment effectiveness (OEE); raw tool time (RTT); recipe train; speed loss; steady state speed; takt time;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2008.2001212