DocumentCode :
826265
Title :
Laser diode burn-in and reliability testing
Author :
Johnson, Lawrence A.
Volume :
44
Issue :
2
fYear :
2006
Firstpage :
4
Lastpage :
7
Abstract :
More than 99 percent of all lasers manufactured in the world today are semiconductor laser diodes. Reliability is a concern in every laser diode application, whether it is a simple $10 laser pointer or a space-qualified optical transmitter link. The commercial success of a laser supplier rests largely on his ability to develop a robust manufacturing process that consistently produces reliable devices combined with the quantitative assurances he can provide to his customers proving the reliability of his devices. Over the past two decades, laser diode reliability testing techniques and equipment have evolved to support the diverse development of laser diodes.
Keywords :
manufacturing processes; optical testing; reliability; semiconductor lasers; manufacturing process; reliability; reliable devices; semiconductor laser diodes; Diode lasers; Hazards; Laser modes; Manufacturing processes; Noise measurement; Optical pulses; Packaging; Semiconductor lasers; Temperature; Testing;
fLanguage :
English
Journal_Title :
Communications Magazine, IEEE
Publisher :
ieee
ISSN :
0163-6804
Type :
jour
DOI :
10.1109/MCOM.2006.1593543
Filename :
1593543
Link To Document :
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