Title :
Beam Profile Monitor Provides Multiple Profile during Beam Spill at Fermilab
Author :
Haldeman, M. ; Haynes, B. ; Lahey, T.
Abstract :
A sampling, 96 channel NIM module scanner, which when used in conjunction with Fermilab´s conventional 96 wire ionization chambers (WIC´s), provides up to ten (96-channel) samples of the charged particle beam profiles during a beam spill. The ability to sample as often as four milliseconds, with minimum sample times of 1 ¿second, allows this system to be used at particle rates from 105 to 1014 particles per second per wire, making it useful for beam tuning as well as normal running. The 96 analog channels are digitized after each sample and stored in a 1K à 12 bid RAM. The RAM provides data for local analog output, through a D/A coverter/driver and for block data transfers via a CAMAC controller module to a processor for software data manipulation.
Keywords :
CAMAC; Capacitors; Connectors; Monitoring; Particle beams; Pulse amplifiers; Sampling methods; Testing; Voltage; Wire;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4328717