Title :
Fail-Safe Logic Elements for Use with Reactor Safety Systems
Author :
Bobis, James P. ; McDowell, William P.
Author_Institution :
Argonne National Laboratory Argonne, Illinois 60439
Abstract :
A complete fail-safe trip circuit is described which utilizes fail-safe logic elements. The logic elements1 used are analog multipliers and active bandpass filter networks. These elements perform Boolean operations on a set of AC signals from the output of a reactor safety-channel trip comparator.
Keywords :
Active filters; Adders; Band pass filters; Circuits; Filtering theory; Frequency; Inductors; Logic devices; Safety; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4328761
