Title :
Filtering effects on permittivity profiles reconstructed by a spectral inverse scattering technique
Author :
Lee, J.M. ; Kim, S.Y. ; Ra, J.W.
Author_Institution :
Key Technol. Lab., R&D Center, Samsung Electronics, Suwon, South Korea
fDate :
12/1/1992 12:00:00 AM
Abstract :
A study is made of the reconstruction of permittivity profiles using the spectral inverse scattering scheme with the moment-method procedures. Based on earlier works, the reconstructed profiles have been affected by large errors even with a negligible random noise of the measured field. One of the intuitive approaches to reduce these errors has been implemented successfully by employing a polynomial basis function to the induced field on each enlarged cell in conjunction with a suitable weighting function. Another method is presented which adopts a low-pass filter to the spatial-Fourier transform of the equivalent source distribution induced in a dielectric object. The accuracy and validity of the spectral filtering are assured by a number of numerical simulations for a simple test geometry
Keywords :
electromagnetic wave scattering; inverse problems; low-pass filters; microwave measurement; numerical analysis; permittivity; dielectric object; electromagnetic scattering; equivalent source distribution; low-pass filter; moment-method; permittivity profiles; polynomial basis function; spatial-Fourier transform; spectral filtering; spectral inverse scattering technique; weighting function;
Journal_Title :
Microwaves, Antennas and Propagation, IEE Proceedings H