Filtering effects on permittivity profiles reconstructed by a spectral inverse scattering technique

Author

Lee, J.M. ; Kim, S.Y. ; Ra, J.W.

Author_Institution

Key Technol. Lab., R&D Center, Samsung Electronics, Suwon, South Korea

Volume

139

Issue

6

fYear

1992

fDate

12/1/1992 12:00:00 AM

Firstpage

507

Lastpage

512

Abstract

A study is made of the reconstruction of permittivity profiles using the spectral inverse scattering scheme with the moment-method procedures. Based on earlier works, the reconstructed profiles have been affected by large errors even with a negligible random noise of the measured field. One of the intuitive approaches to reduce these errors has been implemented successfully by employing a polynomial basis function to the induced field on each enlarged cell in conjunction with a suitable weighting function. Another method is presented which adopts a low-pass filter to the spatial-Fourier transform of the equivalent source distribution induced in a dielectric object. The accuracy and validity of the spectral filtering are assured by a number of numerical simulations for a simple test geometry

Keywords

electromagnetic wave scattering; inverse problems; low-pass filters; microwave measurement; numerical analysis; permittivity; dielectric object; electromagnetic scattering; equivalent source distribution; low-pass filter; moment-method; permittivity profiles; polynomial basis function; spatial-Fourier transform; spectral filtering; spectral inverse scattering technique; weighting function;

fLanguage

English

Journal_Title

Microwaves, Antennas and Propagation, IEE Proceedings H

Publisher

iet

ISSN

0950-107X

Type

jour

Filename

180454