DocumentCode :
827175
Title :
Coupling between photonic crystal waveguides
Author :
Kuchinsky, Sergey ; Golyatin, Vladislav Y. ; Kutikov, Alexander Y. ; Pearsall, Thomas P. ; Nedelikovic, D.
Author_Institution :
Corning Sci. Center, St. Petersburg, Russia
Volume :
38
Issue :
10
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
1349
Lastpage :
1352
Abstract :
A calculation procedure for evaluation of the coupling length of two parallel coupled channel waveguides in a planar photonic crystal is proposed. The first step of the calculation is evaluation of the band structure of a photonic crystal containing two coupled linear defects. The eigenvalue corresponding to eigenstates localized in the linear defect (the waveguide) is split due to the coupling. This splitting is treated within the coupled-mode theory that yields a simple relation between the splitting and the coupling length. The MIT photonic bands code is used to evaluate the coupling between channel waveguides in silicon.1 These calculations show that in contrast to the finite-difference time-domain approach, the method is effective for three-dimensional light propagation.
Keywords :
band structure; coupled mode analysis; eigenvalues and eigenfunctions; finite difference time-domain analysis; optical couplers; optical planar waveguides; optical waveguide theory; photonic band gap; 3D light propagation; band structure; calculation procedure; channel waveguides; coupled-mode theory; coupling length; eigenstates; eigenvalue; finite-difference time-domain approach; linear defect; linear defects; parallel coupled channel waveguides; photonic bands code; photonic crystal waveguide coupling; planar photonic crystal; splitting length; three-dimensional light propagation; Electromagnetic waveguides; Finite difference methods; Optical crosstalk; Optical planar waveguides; Optical propagation; Optical waveguides; Photonic crystals; Planar waveguides; Slabs; Time domain analysis;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2002.802954
Filename :
1035982
Link To Document :
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