• DocumentCode
    827196
  • Title

    An integrated equivalent circuit model for relative intensity noise and frequency noise spectrum of a multimode semiconductor laser

  • Author

    Mortazy, Ebrahim ; Ahmadi, Vahid ; Moravvej-Farshi, Mohammad Kazem

  • Author_Institution
    Dept. of Electron. Eng., Tarbiat Modares Univ., Tehran, Iran
  • Volume
    38
  • Issue
    10
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1366
  • Lastpage
    1371
  • Abstract
    Relative intensity noise (RIN) and the frequency/phase noise spectrum (FNS) equivalent circuit of a multimode semiconductor laser diode are derived from multimode rate equations with the inclusion of noise Langevin sources. FNS is an important parameter in optical communication systems, and its circuit model is presented, for the first time, in this paper. Both circuit models for RIN and FNS are integrated in one circuit. RIN and FNS are calculated as functions of frequency, output power, and mode number. It is shown that the RIN of the main mode is increased in the multimode lasers with higher mode numbers. Furthermore, we show that RIN and FNS are enhanced for higher output power. The dependency of a multimode laser diode linewidth on output power is also analyzed using the model.
  • Keywords
    equivalent circuits; laser modes; laser noise; optical transmitters; semiconductor device models; semiconductor device noise; semiconductor lasers; spectral line breadth; circuit model; frequency noise spectrum; integrated equivalent circuit model; main mode; mode number; multimode laser diode; multimode laser diode linewidth; multimode rate equations; multimode semiconductor laser; noise Langevin sources; optical communication systems; output power; relative intensity noise; Diode lasers; Equivalent circuits; Frequency; Laser modes; Laser noise; Optical noise; Phase noise; Power generation; Semiconductor device noise; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2002.802975
  • Filename
    1035984