DocumentCode :
82731
Title :
Development and Validation of the Electron Slot Region Radiation Environment Model
Author :
Sandberg, I. ; Daglis, I.A. ; Heynderickx, Daniel ; Truscott, Pete ; Hands, A. ; Evans, Hugh ; Nieminen, Petteri
Author_Institution :
Inst. for Astron., Astrophys., Space Applic. & Remote Sensing, Nat. Obs. of Athens, Penteli, Greece
Volume :
61
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1656
Lastpage :
1662
Abstract :
In this work we present the development of the electron Slot Region Radiation Environment Model (e-SRREM). e-SRREM is a data-based statistical model which has been built on fifteen years of electron flux measurements. The model describes the trapped electron radiation in a region that includes the slot region between the inner and the outer electron radiation belts. The model provides energetic electron fluxes with their uncertainties determined by confidence levels for user-defined mission orbit and duration. First comparisons of e-SRREM with the AE8 and International Radiation Environment Near Earth (IRENE) AE9 models show that the aforementioned models underestimate the electron flux levels along highly elliptic orbit that crosses the slot region. Extensive testings and comparisons will follow in future work.
Keywords :
radiation belts; statistical analysis; AE8 model; International Radiation Environment Near Earth AE9 model; confidence levels; data-based statistical model; e-SRREM; electron Slot Region Radiation Environment Model; electron flux levels; electron flux measurements; elliptic orbit; energetic electron fluxes; inner electron radiation belt; outer electron radiation belt; trapped electron radiation; user-defined mission duration; user-defined mission orbit; Atmospheric measurements; Belts; Electron traps; Extraterrestrial measurements; Histograms; Orbits; Space vehicles; Electrons; radiation belts; radiation monitoring; semiconductor radiation detectors; solar system; space charge; sun;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2304982
Filename :
6799309
Link To Document :
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