• DocumentCode
    827587
  • Title

    Dark-line-resistant, aluminum-free diode laser at 0.8 mu m

  • Author

    Yellen, S.L. ; Shepard, A.H. ; Harding, C.M. ; Baumann, J.A. ; Waters, R.G. ; Garbuzov, D.Z. ; Pjataev, V. ; Kochergin, V. ; Zory, P.S.

  • Author_Institution
    McDonnell Douglas Electron. Syst. Co., Elmsford, NY, USA
  • Volume
    4
  • Issue
    12
  • fYear
    1992
  • Firstpage
    1328
  • Lastpage
    1330
  • Abstract
    Quantum-well, lattice-matched InGaAsP lasers emitting at 0.8 mu m are shown to exhibit resistance to
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; semiconductor laser arrays; semiconductor lasers; 0.8 micron; Al-free diode laser; IR; InGaAsP lasers; QW lasers; dark-line resistant; device structure; diode laser arrays; electron beam induced current; high-power diodes; lattice-matched; life testing; quantum well lasers; semiconductors; Conducting materials; Diode lasers; Epitaxial growth; Gallium arsenide; Indium gallium arsenide; Optical materials; Photonic band gap; Quantum well lasers; Semiconductor laser arrays; Substrates;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.180565
  • Filename
    180565