• DocumentCode
    827845
  • Title

    Fault area estimation via intelligent processing of fault-induced transients

  • Author

    Galijasevic, Zijad ; Abur, Ali

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    18
  • Issue
    4
  • fYear
    2003
  • Firstpage
    1241
  • Lastpage
    1247
  • Abstract
    This paper presents a new method for estimating the fault area in electric power systems. The method is based on processing fault-induced electromagnetic transients through pattern matching. In this process, distinctive features of the recorded fault event are matched with the features of a large number of representative faults. The method originates from the concept of vulnerability contours which are used to assess the likelihood of voltage sags effecting a given network region. A limited number of sparsely located voltage waveform recording devices is used. Intelligent computing techniques are used to identify the most likely fault area. The method is aimed at complementing an earlier-developed technique for estimating fault location based on phasor voltage measurements. Good performance of the method is demonstrated through several examples using ATP simulations.
  • Keywords
    fault location; pattern matching; power system analysis computing; power system faults; power system parameter estimation; power system transients; voltage measurement; ATP simulations; fault area estimation; fault-induced electromagnetic transients; fault-induced transients; intelligent computing techniques; intelligent processing; pattern matching; phasor voltage measurements; sparsely located voltage waveform recording devices; voltage sags; vulnerability contours; Electromagnetic transients; Fault location; Instruments; Power system faults; Power system protection; Power system stability; Power system transients; Power transmission lines; Transmission line measurements; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2003.814854
  • Filename
    1245543