DocumentCode :
828172
Title :
Dielectric response measurements utilizing semi-square voltage waveforms
Author :
Sonerud, Björn ; Bengtsson, Tord ; Blennow, Jörgen ; Gubanski, Stanislaw M.
Author_Institution :
Dept. of Mater. & Manuf. Technol., Chalmers Univ. of Technol., Goteborg
Volume :
15
Issue :
4
fYear :
2008
fDate :
8/1/2008 12:00:00 AM
Firstpage :
920
Lastpage :
926
Abstract :
Dielectric response measurements belong to the group of diagnostic tools used for quality evaluation of high voltage insulation systems. A measurement system called arbitrary waveform impedance spectroscopy (AWIS) is presented here which is capable of utilizing the harmonic content of repetitive voltages with a semi-square waveform and the corresponding current response to perform dielectric response measurements. Extensive circuit modeling and calibrations are required in order to perform accurate measurements. AWIS could offer new possibilities, especially for continuous monitoring of the dielectric properties of high voltage components and systems. The accuracy of the technique in both low and high voltage applications is verified by comparison with results obtained by means of the frequency domain spectroscopy (FDS) technique.
Keywords :
frequency-domain analysis; insulation testing; spectroscopy; arbitrary waveform impedance spectroscopy; circuit modeling; current response; diagnostic tools; dielectric response measurements; frequency domain spectroscopy; harmonic content; high voltage insulation systems; quality evaluation; repetitive voltages; semi-square voltage waveforms; Calibration; Circuits; Current measurement; Dielectric measurements; Dielectrics and electrical insulation; Electrochemical impedance spectroscopy; Impedance measurement; Monitoring; Performance evaluation; Voltage measurement; Dielectric measurements, discrete Fourier transforms, aging, monitoring, dielectric materials, insulation testing;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2008.4591211
Filename :
4591211
Link To Document :
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