DocumentCode
828342
Title
Breakdown strength of solid dielectrics in liquid nitrogen
Author
Masood, A. ; Zuberi, M.U. ; Husain, E.
Author_Institution
Dept. of Electr. Eng., Aligarh Muslim Univ., Aligarh
Volume
15
Issue
4
fYear
2008
fDate
8/1/2008 12:00:00 AM
Firstpage
1051
Lastpage
1055
Abstract
The objective of this research was to determine if a relationship could be found between dielectric strength and other properties of electrical insulating materials in the medium of liquid nitrogen on an empirical basis by using variables predicted by basic theory. A simple equation of the form E=A+Blog (rhov/xir tandelta) to predict the dielectric strength of a solid insulating material in liquid nitrogen medium has been proposed. The equation requires the values of volume resistivity (rhov), relative permittivity (xir) and loss tangent (tandelta) in the medium of liquid nitrogen, which may be obtained easily by low voltage non-destructive measurements. The values of electric strength calculated using this equation for Crepe paper, Kraft paper, varnished paper, pressboard, presspahn, mica, bakelite and asbestos are quite in agreement with the experimentally measured values. It is expected that the equations obtained will help the designers as a handy tool for quick estimation of breakdown strength of solid dielectrics dipped in liquid nitrogen.
Keywords
electric breakdown; insulation testing; low-temperature techniques; Crepe paper; Kraft paper; asbestos; bakelite; electrical insulating materials; liquid nitrogen; low voltage nondestructive measurements; mica; pressboard; presspahn; solid dielectric breakdown strength; solid insulating material; varnished paper; Conductivity; Dielectric breakdown; Dielectric liquids; Dielectric loss measurement; Dielectric materials; Dielectrics and electrical insulation; Equations; Nitrogen; Permittivity; Solids; Breakdown strength, liquid nitrogen, loss tangent, volume resistivity, solid dielectrics, Crepe paper, Kraft paper, varnished paper, pressboard, presspahn, mica, bakelite, asbestos;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2008.4591227
Filename
4591227
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