DocumentCode :
828389
Title :
Correlation study between VAD preform deposition surface and Germanium doping profiles
Author :
dos Santos, Juliana Santiago ; Ono, Eduardo ; Gusken, Edmilton ; Suzuki, Carlos Kenichi
Author_Institution :
Fac. of Mech. Eng., State Univ. of Campinas, Brazil
Volume :
24
Issue :
2
fYear :
2006
Firstpage :
831
Lastpage :
837
Abstract :
The refractive index profile of germanium doped preforms for optical fibers is determined by the radial distribution of germanium concentration. Knowing that there is a correlation between the germanium doping profile and the deposition surface profile of vapor-phase axial deposition (VAD) preforms, the study of this correlation has been carried out in order to estimate, indirectly, the refractive index profile of VAD preforms for optical fibers during the deposition stage. This correlation was studied through the parameterization of the preform deposition surface using two parameters: the power law index profile that best fits the preform bottom profile (α) and the axial distance from the bottom tip to a reference height (h). A range of values of these parameters to produce VAD preforms with standard and special doping profiles has been presented. Preforms with triangular index profile can be fabricated with α and h values of about 2.0 and 5.0 mm, respectively, and preforms with parabolic index profiles can be produced with α and h values of about 2.0 and 4.0 mm, respectively.
Keywords :
correlation methods; doping profiles; germanium compounds; impurity distribution; optical fibre fabrication; preforms; refractive index; surface topography; vapour deposition; SiO2:GeO2; correlation study; deposition surface parameterization; deposition surface profile; germanium concentration; germanium doped preforms; germanium doping profile; optical fibers; parabolic index profiles; power law index profile; preform bottom profile; refractive index profile; triangular index profile; vapor-phase axial deposition preforms; Doping profiles; Germanium; Optical fibers; Optical refraction; Optical surface waves; Preforms; Refractive index; Shape control; Temperature dependence; Wavelength division multiplexing; Germanium doping profile; VAD technique; preform deposition surface; refractive index profile;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2005.861936
Filename :
1593754
Link To Document :
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