• DocumentCode
    828389
  • Title

    Correlation study between VAD preform deposition surface and Germanium doping profiles

  • Author

    dos Santos, Juliana Santiago ; Ono, Eduardo ; Gusken, Edmilton ; Suzuki, Carlos Kenichi

  • Author_Institution
    Fac. of Mech. Eng., State Univ. of Campinas, Brazil
  • Volume
    24
  • Issue
    2
  • fYear
    2006
  • Firstpage
    831
  • Lastpage
    837
  • Abstract
    The refractive index profile of germanium doped preforms for optical fibers is determined by the radial distribution of germanium concentration. Knowing that there is a correlation between the germanium doping profile and the deposition surface profile of vapor-phase axial deposition (VAD) preforms, the study of this correlation has been carried out in order to estimate, indirectly, the refractive index profile of VAD preforms for optical fibers during the deposition stage. This correlation was studied through the parameterization of the preform deposition surface using two parameters: the power law index profile that best fits the preform bottom profile (α) and the axial distance from the bottom tip to a reference height (h). A range of values of these parameters to produce VAD preforms with standard and special doping profiles has been presented. Preforms with triangular index profile can be fabricated with α and h values of about 2.0 and 5.0 mm, respectively, and preforms with parabolic index profiles can be produced with α and h values of about 2.0 and 4.0 mm, respectively.
  • Keywords
    correlation methods; doping profiles; germanium compounds; impurity distribution; optical fibre fabrication; preforms; refractive index; surface topography; vapour deposition; SiO2:GeO2; correlation study; deposition surface parameterization; deposition surface profile; germanium concentration; germanium doped preforms; germanium doping profile; optical fibers; parabolic index profiles; power law index profile; preform bottom profile; refractive index profile; triangular index profile; vapor-phase axial deposition preforms; Doping profiles; Germanium; Optical fibers; Optical refraction; Optical surface waves; Preforms; Refractive index; Shape control; Temperature dependence; Wavelength division multiplexing; Germanium doping profile; VAD technique; preform deposition surface; refractive index profile;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2005.861936
  • Filename
    1593754