Title :
Low-cost software-based self-testing of RISC processor cores
Author :
Kranitis, N. ; Xenoulis, G. ; Gizopoulos, D. ; Paschalis, A. ; Zorian, Y.
Author_Institution :
Dept. of Informatics & Telecommun., Univ. of Athens, Greece
Abstract :
Software self-testing of embedded processor cores, which effectively partitions the testing effort between low-speed external equipment and internal processor resources, has been recently proposed as an alternative to classical hardware built-in self-test techniques over which it provides significant advantages. A low-cost software-based self-testing methodology for processor cores is presented with the aim of producing compact test code sequences developed with a limited engineering effort and achieving a high fault coverage for the processor core. The objective of small test code sequences is directly related to the utilisation of low-speed external testers, since test time is primarily determined by the time required to download the test code to the processor memory at the tester´s low frequency. Successful application of the methodology to an RISC processor core architecture with a three-stage pipeline is demonstrated
Keywords :
built-in self test <RISC processor cores, low-cost software-based self-testing>; microprocessor chips <RISC processor cores, low-cost software-based self-testing>; reduced instruction set computing <processor cores, low-cost software-based self-testing>; BIST; RISC processor cores; built-in self-test techniques; compact test code sequences; embedded processor cores; internal processor resources; low-cost software-based self-testing; low-speed external equipment; low-speed external testers; processor cores; small test code sequences; three-stage pipeline;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings -
DOI :
10.1049/ip-cdt:20030838