Title :
Statistical Sampling-Based Parametric Analysis of Power Grids
Author_Institution :
Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX
Abstract :
A statistical sampling-based parametric analysis is presented for analyzing large power grids in a "localized" fashion. By combining random walks with the notion of "importance sampling," the proposed technique is capable of efficiently computing the impacts of multiple circuit parameters on selected network nodes. A "new localized" sensitivity analysis is first proposed to solve not only the nominal node response but also its sensitivities with respect to multiple parameters using a single run of the random walks algorithm. This sampling-based technique is further extended from the first-order sensitivity analysis to a more general second-order analysis. By exploiting the natural spatial locality inherent in the proposed algorithm formulation, the second-order analysis can be performed efficiently even for a large number of global and local variation sources. The theoretical convergence properties of three importance sampling estimators for power grid analysis are presented, and their effectiveness is compared experimentally on several examples. The superior performance of the proposed technique is demonstrated by analyzing several large power grids under process and current loading variations to which the application of the existing brute-force simulation techniques becomes completely infeasible
Keywords :
importance sampling; network analysis; power supply circuits; circuit simulation; importance sampling; integrated circuits; power distribution networks; power grid parametric analysis; random walks; statistical sampling; Analytical models; Chip scale packaging; Circuit simulation; Computer networks; Convergence; Monte Carlo methods; Performance analysis; Power grids; Power systems; Sensitivity analysis; Circuit simulation; integrated circuits; power distribution networks;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.882582