• DocumentCode
    828680
  • Title

    A stable fourth-order FDTD method for modeling electrically long dielectric waveguides

  • Author

    Hwang, Kyu-Pyung ; Ihm, Jae-Yong

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • Volume
    24
  • Issue
    2
  • fYear
    2006
  • Firstpage
    1048
  • Lastpage
    1056
  • Abstract
    Accurate time-domain modeling of electrically long structures such as dielectric waveguides in integrated optics often demands prohibitive computational cost. In this paper, an efficient fourth-order finite-difference time-domain (FDTD) method is investigated in a two-dimensional (2-D) transverse electric (TE) case. The method is a combination of fourth-order staggered backward-differentiation time integrator and fourth-order staggered spatial discretization. A rigorous stability and dispersion analysis is conducted to show its useful numerical characteristics. Fourth-order convergence of the numerical scheme is demonstrated by monitoring numerical errors in the L2 norm in 2-D cavities. Numerical efficiency of the fourth-order method is validated through its applications for full-wave time-domain simulations of long 2-D optical waveguide structures.
  • Keywords
    finite difference time-domain analysis; numerical stability; optical dispersion; optical waveguide theory; convergence of numerical methods; dielectric waveguides; finite-difference time-domain; fourth-order FDTD method; fourth-order staggered backward-differentiation time integrator; fourth-order staggered spatial discretization; integrated optics; Computational efficiency; Convergence of numerical methods; Dielectrics; Finite difference methods; Integrated optics; Optical waveguides; Stability analysis; Tellurium; Time domain analysis; Two dimensional displays; Convergence of numerical methods; dielectric waveguides; finite-difference time-domain (FDTD) methods; optical waveguide; waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2005.862440
  • Filename
    1593782