DocumentCode
828902
Title
Experimental realization of a new transistor
Author
Chen, Jing ; Yang, Chia-Hung ; Wilson, Richard A.
Author_Institution
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Volume
40
Issue
2
fYear
1993
fDate
2/1/1993 12:00:00 AM
Firstpage
267
Lastpage
272
Abstract
The authors report on the fabrication and characteristics of a unipolar, three-terminal, resonant-tunneling transistor. The operating principle of this new transistor is based on the fact that the quantum mechanical resonant-tunneling probability of hot electrons between the emitter and the collector is switched almost completely on and off, when either the base or the collector bias is swept. The emitter injects hot electrons to the second lowest subband of a thin (100 Å in this work) GaAs quantum well. Subsequently, the hot electrons will either resonantly tunnel to the collector, or relax to the lowest subband and contribute to the base current. As a result of resonant transmission, at 77 K the current-voltage characteristics of the transistor display negative differential resistance with extremely large (4691) peak-to-valley ratio. Furthermore, when biased near resonance, a maximum DC current gain of ~1.2 and a maximum AC current gain of ~11.9 were observed. The first use of a new `tunneling-in and tunneling-out´ scheme in contacting a thin quantum well is also demonstrated
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; hot electron transistors; negative resistance; resonant tunnelling devices; GaAs quantum well; GaAs-AlxGa1-xAs; base current; current-voltage characteristics; hot electrons; maximum AC current gain; maximum DC current gain; negative differential resistance; peak-to-valley ratio; quantum mechanical resonant-tunneling probability; resonant transmission; tunnelling in tunnelling out scheme; unipolar three terminal resonant tunnelling transistor; Current-voltage characteristics; Displays; Electron emission; Fabrication; Gallium arsenide; Helium; Molecular beam epitaxial growth; Quantum mechanics; Resonance; Resonant tunneling devices;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.182499
Filename
182499
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