DocumentCode :
82892
Title :
Comparison of System-Level ESD Design Methodologies—Towards the Efficient and ESD Robust Design of Systems
Author :
Scholz, Matthias ; Shih-Hung Chen ; Vandersteen, Gerd ; Linten, D. ; Hellings, Geert ; Sawada, Masanori ; Groeseneken, Guido
Author_Institution :
Interuniv. Microelectron. Centre (Imec) vzw, Leuven, Belgium
Volume :
13
Issue :
1
fYear :
2013
fDate :
Mar-13
Firstpage :
213
Lastpage :
222
Abstract :
Three system-level electrostatic discharge (ESD) design methodologies are compared using an RF buffer amplifier as case study. First, the system-level ESD protection is designed with datasheet information. The obtained overdesigned ESD protection is optimized with the System-Efficient ESD Design (SEED) methodology. The SEED-based protection design is further optimized using human metal model testing and transient simulations. The final ESD protection design requires five times less area on the application board, and the capacitive loading is six times lower than when designing with datasheet information.
Keywords :
buffer circuits; electrostatic discharge; integrated circuit reliability; radiofrequency amplifiers; RF buffer amplifier; SEED methodology; robust design of systems; system-efficient ESD design; system-level ESD design; system-level electrostatic discharge design; Capacitance; Electrostatic discharges; Hidden Markov models; Inductance; Radio frequency; Stress; System-on-a-chip; Electrostatic discharge (ESD); IC reliability; reliability; system analysis and design;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2012.2231414
Filename :
6373715
Link To Document :
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