DocumentCode
82892
Title
Comparison of System-Level ESD Design Methodologies—Towards the Efficient and ESD Robust Design of Systems
Author
Scholz, Matthias ; Shih-Hung Chen ; Vandersteen, Gerd ; Linten, D. ; Hellings, Geert ; Sawada, Masanori ; Groeseneken, Guido
Author_Institution
Interuniv. Microelectron. Centre (Imec) vzw, Leuven, Belgium
Volume
13
Issue
1
fYear
2013
fDate
Mar-13
Firstpage
213
Lastpage
222
Abstract
Three system-level electrostatic discharge (ESD) design methodologies are compared using an RF buffer amplifier as case study. First, the system-level ESD protection is designed with datasheet information. The obtained overdesigned ESD protection is optimized with the System-Efficient ESD Design (SEED) methodology. The SEED-based protection design is further optimized using human metal model testing and transient simulations. The final ESD protection design requires five times less area on the application board, and the capacitive loading is six times lower than when designing with datasheet information.
Keywords
buffer circuits; electrostatic discharge; integrated circuit reliability; radiofrequency amplifiers; RF buffer amplifier; SEED methodology; robust design of systems; system-efficient ESD design; system-level ESD design; system-level electrostatic discharge design; Capacitance; Electrostatic discharges; Hidden Markov models; Inductance; Radio frequency; Stress; System-on-a-chip; Electrostatic discharge (ESD); IC reliability; reliability; system analysis and design;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2012.2231414
Filename
6373715
Link To Document