• DocumentCode
    82892
  • Title

    Comparison of System-Level ESD Design Methodologies—Towards the Efficient and ESD Robust Design of Systems

  • Author

    Scholz, Matthias ; Shih-Hung Chen ; Vandersteen, Gerd ; Linten, D. ; Hellings, Geert ; Sawada, Masanori ; Groeseneken, Guido

  • Author_Institution
    Interuniv. Microelectron. Centre (Imec) vzw, Leuven, Belgium
  • Volume
    13
  • Issue
    1
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    213
  • Lastpage
    222
  • Abstract
    Three system-level electrostatic discharge (ESD) design methodologies are compared using an RF buffer amplifier as case study. First, the system-level ESD protection is designed with datasheet information. The obtained overdesigned ESD protection is optimized with the System-Efficient ESD Design (SEED) methodology. The SEED-based protection design is further optimized using human metal model testing and transient simulations. The final ESD protection design requires five times less area on the application board, and the capacitive loading is six times lower than when designing with datasheet information.
  • Keywords
    buffer circuits; electrostatic discharge; integrated circuit reliability; radiofrequency amplifiers; RF buffer amplifier; SEED methodology; robust design of systems; system-efficient ESD design; system-level ESD design; system-level electrostatic discharge design; Capacitance; Electrostatic discharges; Hidden Markov models; Inductance; Radio frequency; Stress; System-on-a-chip; Electrostatic discharge (ESD); IC reliability; reliability; system analysis and design;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2012.2231414
  • Filename
    6373715