• DocumentCode
    828941
  • Title

    AlGaAs and GaAsP high-power ultrafast p+-n-n+ diodes based on heterojunctions and a graded-gap base

  • Author

    Ashkinazi, German A. ; Leibovitch, Marc G. ; Nathan, Menachem

  • Author_Institution
    Dept. of Electr. Eng.-Phys. Electron., Tel Aviv Univ., Israel
  • Volume
    40
  • Issue
    2
  • fYear
    1993
  • fDate
    2/1/1993 12:00:00 AM
  • Firstpage
    285
  • Lastpage
    291
  • Abstract
    The authors present a theoretical model of power p+-n-n + diodes with a graded-gap base and either homojunctions (GB) or heterojunctions (HGB), and numerical calculations of static and dynamic characteristics of AlGaAs (GaAsP) based structures. It is shown that HGB diodes will exhibit characteristics and properties significantly better than those of simple (homojunctions plus uniform base) GaAs and Si diodes. For example, the forward voltage drop in a high-voltage (W/Lp=13) high-frequency (trr=25 ns) HGB diode will be 50% and 300% smaller than the drop in, respectively, simple GaAs and Si diodes with the same W/Lp and trr. Other significant projected improvements include operation up to 450°C, an order of magnitude reduction in the reverse current, and a 50% increase in the breakdown voltage
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; gallium compounds; power electronics; semiconductor device models; semiconductor diodes; AlGaAs; GaAsP; breakdown voltage; dynamic characteristics; forward voltage drop; graded-gap base; heterojunctions; high frequency HGB diode; high-power ultrafast p+-n-n+ diodes; model; numerical calculations; power electronic devices; reverse current; reverse recovery; static characteristics; Current density; Electrons; Gallium arsenide; Heterojunctions; P-i-n diodes; Photonic band gap; Radiative recombination; Semiconductor diodes; Spontaneous emission; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.182502
  • Filename
    182502