Title :
Online Multiple Kernel Similarity Learning for Visual Search
Author :
Hao Xia ; Hoi, Steven C. H. ; Rong Jin ; Peilin Zhao
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
Recent years have witnessed a number of studies on distance metric learning to improve visual similarity search in content-based image retrieval (CBIR). Despite their successes, most existing methods on distance metric learning are limited in two aspects. First, they usually assume the target proximity function follows the family of Mahalanobis distances, which limits their capacity of measuring similarity of complex patterns in real applications. Second, they often cannot effectively handle the similarity measure of multimodal data that may originate from multiple resources. To overcome these limitations, this paper investigates an online kernel similarity learning framework for learning kernel-based proximity functions which goes beyond the conventional linear distance metric learning approaches. Based on the framework, we propose a novel online multiple kernel similarity (OMKS) learning method which learns a flexible nonlinear proximity function with multiple kernels to improve visual similarity search in CBIR. We evaluate the proposed technique for CBIR on a variety of image data sets in which encouraging results show that OMKS outperforms the state-of-the-art techniques significantly.
Keywords :
image retrieval; learning (artificial intelligence); CBIR; Mahalanobis distance; OMKS learning method; content-based image retrieval; distance metric learning; image data sets; kernel-based proximity functions; multimodal data; online multiple kernel similarity learning; similarity measure; visual similarity search; Algorithm design and analysis; Image retrieval; Kernel; Measurement; Optimization; Support vector machines; Visualization; Similarity search; content-based image retrieval; kernel methods; multiple kernel learning; online learning;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2013.149