Fault management of multicell converters

Author

Turpin, Christophe ; Baudesson, Philippe ; Richardeau, Frédéric ; Forest, François ; Meynard, Thierry A.

Author_Institution

Lab. d´´Electrotech. et d´´Electron. Ind., CNRS, Toulouse, France

Volume

49

Issue

5

fYear

2002

fDate

10/1/2002 12:00:00 AM

Firstpage

988

Lastpage

997

Abstract

Component counts and oversimplified reliability rules may lead to the conclusion that multilevel converters are less safe than two-level converters, just because they use more components. A better approach might be to consider that they use a different arrangement of components and also that the consequence of faults may be very different. This paper is focused on the study of the consequences of faults in hard-switching and soft-switching multicell converters. Solutions to minimize the consequences of major faults are described.

Keywords

fault location; insulated gate bipolar transistors; power convertors; power system harmonics; switching circuits; fault detection; fault location; fault management; fault tolerance; hard-switching multicell converters; insulated gate bipolar transistors; multicell converters; multilevel systems; oversimplified reliability rules; power electronics; power systems harmonics; soft-switching multicell converters; Circuit faults; Electrical fault detection; Explosions; Insulated gate bipolar transistors; Leg; Switches; Switching circuits; Switching converters; Voltage control; Zero voltage switching;

fLanguage

English

Journal_Title

Industrial Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0278-0046

Type

jour

DOI

10.1109/TIE.2002.803196

Filename

1036748