DocumentCode :
829095
Title :
Fault management of multicell converters
Author :
Turpin, Christophe ; Baudesson, Philippe ; Richardeau, Frédéric ; Forest, François ; Meynard, Thierry A.
Author_Institution :
Lab. d´´Electrotech. et d´´Electron. Ind., CNRS, Toulouse, France
Volume :
49
Issue :
5
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
988
Lastpage :
997
Abstract :
Component counts and oversimplified reliability rules may lead to the conclusion that multilevel converters are less safe than two-level converters, just because they use more components. A better approach might be to consider that they use a different arrangement of components and also that the consequence of faults may be very different. This paper is focused on the study of the consequences of faults in hard-switching and soft-switching multicell converters. Solutions to minimize the consequences of major faults are described.
Keywords :
fault location; insulated gate bipolar transistors; power convertors; power system harmonics; switching circuits; fault detection; fault location; fault management; fault tolerance; hard-switching multicell converters; insulated gate bipolar transistors; multicell converters; multilevel systems; oversimplified reliability rules; power electronics; power systems harmonics; soft-switching multicell converters; Circuit faults; Electrical fault detection; Explosions; Insulated gate bipolar transistors; Leg; Switches; Switching circuits; Switching converters; Voltage control; Zero voltage switching;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2002.803196
Filename :
1036748
Link To Document :
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