• DocumentCode
    829166
  • Title

    Modeling of quantum effects in ultrasmall HEMT devices

  • Author

    Zhou, Jing-Rong ; Ferry, David K.

  • Author_Institution
    Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
  • Volume
    40
  • Issue
    2
  • fYear
    1993
  • fDate
    2/1/1993 12:00:00 AM
  • Firstpage
    421
  • Lastpage
    427
  • Abstract
    Numerical simulation of ultra-submicrometer high electron mobility transistors based upon a set of quantum moment equations is presented. These provide a first quantum description, based upon the moments of the Wigner distribution function. In HEMTs, the conduction electrons are confined in a narrow conduction channel and the short gate lengths (and small aspect ratio) create different potential barriers across the conduction channel than in a long-channel situation. In these small structures, quantum effects are expected to be prominent. A substantial change in the electron density distribution is found to occur due to the inclusion of these quantum corrections, and the total current in the simulated devices is increased by as much as 10% for a 240-nm gate-length device
  • Keywords
    carrier density; high electron mobility transistors; quantum interference phenomena; semiconductor device models; 240 nm; Wigner distribution function; conduction electron confinement; electron density distribution; narrow conduction channel; numerical simulation; potential barriers; quantum effects modelling; quantum moment equations; short gate lengths; small aspect ratio; total current; ultrasmall HEMT devices; Distribution functions; Electrons; Equations; Fabrication; Gallium arsenide; HEMTs; MESFETs; MODFETs; Quantization; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.182523
  • Filename
    182523