DocumentCode :
829166
Title :
Modeling of quantum effects in ultrasmall HEMT devices
Author :
Zhou, Jing-Rong ; Ferry, David K.
Author_Institution :
Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
Volume :
40
Issue :
2
fYear :
1993
fDate :
2/1/1993 12:00:00 AM
Firstpage :
421
Lastpage :
427
Abstract :
Numerical simulation of ultra-submicrometer high electron mobility transistors based upon a set of quantum moment equations is presented. These provide a first quantum description, based upon the moments of the Wigner distribution function. In HEMTs, the conduction electrons are confined in a narrow conduction channel and the short gate lengths (and small aspect ratio) create different potential barriers across the conduction channel than in a long-channel situation. In these small structures, quantum effects are expected to be prominent. A substantial change in the electron density distribution is found to occur due to the inclusion of these quantum corrections, and the total current in the simulated devices is increased by as much as 10% for a 240-nm gate-length device
Keywords :
carrier density; high electron mobility transistors; quantum interference phenomena; semiconductor device models; 240 nm; Wigner distribution function; conduction electron confinement; electron density distribution; narrow conduction channel; numerical simulation; potential barriers; quantum effects modelling; quantum moment equations; short gate lengths; small aspect ratio; total current; ultrasmall HEMT devices; Distribution functions; Electrons; Equations; Fabrication; Gallium arsenide; HEMTs; MESFETs; MODFETs; Quantization; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.182523
Filename :
182523
Link To Document :
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