DocumentCode
829166
Title
Modeling of quantum effects in ultrasmall HEMT devices
Author
Zhou, Jing-Rong ; Ferry, David K.
Author_Institution
Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
Volume
40
Issue
2
fYear
1993
fDate
2/1/1993 12:00:00 AM
Firstpage
421
Lastpage
427
Abstract
Numerical simulation of ultra-submicrometer high electron mobility transistors based upon a set of quantum moment equations is presented. These provide a first quantum description, based upon the moments of the Wigner distribution function. In HEMTs, the conduction electrons are confined in a narrow conduction channel and the short gate lengths (and small aspect ratio) create different potential barriers across the conduction channel than in a long-channel situation. In these small structures, quantum effects are expected to be prominent. A substantial change in the electron density distribution is found to occur due to the inclusion of these quantum corrections, and the total current in the simulated devices is increased by as much as 10% for a 240-nm gate-length device
Keywords
carrier density; high electron mobility transistors; quantum interference phenomena; semiconductor device models; 240 nm; Wigner distribution function; conduction electron confinement; electron density distribution; narrow conduction channel; numerical simulation; potential barriers; quantum effects modelling; quantum moment equations; short gate lengths; small aspect ratio; total current; ultrasmall HEMT devices; Distribution functions; Electrons; Equations; Fabrication; Gallium arsenide; HEMTs; MESFETs; MODFETs; Quantization; Temperature;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.182523
Filename
182523
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