DocumentCode :
829295
Title :
A 25-Gb/s CDR in 90-nm CMOS for High-Density Interconnects
Author :
Kromer, Christian ; Sialm, Gion ; Menolfi, Christian ; Schmatz, Martin ; Ellinger, Frank ; Jäckel, Heinz
Author_Institution :
Swiss Fed. Inst. of Technol., Zurich
Volume :
41
Issue :
12
fYear :
2006
Firstpage :
2921
Lastpage :
2929
Abstract :
This paper presents a clock-and-data recovery (CDR) for pseudo-synchronous high-density link applications. The CDR is a first-order bang-bang (BB) topology implemented in a standard CMOS process and consists of a phase interpolator, a linear half-rate phase detector, an analog filter followed by a limiter and a digital loop filter operating at a reduced clock rate. A detailed BB CDR analysis derives the maximum tracking range, slew-rate limited jitter tolerance and maximum loop delay. The circuit is optimized for high speed as well as low area and power consumption. The CDR operates from 8-28 Gb/s at a BER of <10-12 and tracks frequency deviations between the incoming data and the reference clock of up to plusmn122 ppm. The sinusoidal jitter tolerance is >0.35UIpp for jitter frequencies les100 MHz and the total timing jitter of the recovered half-rate output data amounts to 0.22 UIpp at a BER=10-12. The core CDR circuit occupies a chip area of 0.07 mm2 and consumes 98 mW from a 1.1-V supply
Keywords :
current-mode logic; digital filters; integrated circuit interconnections; phase detectors; phase locked loops; synchronisation; 1.1 V; 98 mW; CMOS process; analog filter; bang-bang topology; clock-and-data recovery; current-mode logic; data communication; digital loop filter; high-density interconnects; high-speed integrated circuits; limiter; linear half-rate phase detector; maximum loop delay; maximum tracking range; phase interpolator; phase-locked loops; slew-rate limited jitter tolerance; synchronization; CMOS process; Clocks; Detectors; Digital filters; Frequency; Integrated circuit interconnections; Jitter; Nonlinear filters; Phase detection; Topology; Bang-bang CDR; CMOS; clock and data recovery (CDR); current-mode logic (CML); data communication; high-speed integrated circuits; phase-locked loops (PLL); synchronization;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2006.884389
Filename :
4014618
Link To Document :
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