Title :
Energy-storage pulsed-power capacitor technology
Author :
Laghari, Javaid R. ; Sarjeant, W. James
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
fDate :
1/1/1992 12:00:00 AM
Abstract :
Fundamentals of dielectric capacitor technology and multifactor stress aging of all classes of insulating media that form elements of this technology are addressed. The goal is the delineation of failure processes in highly stressed compact capacitors. Factors affecting the complex aging processes such as thermal, electromechanical, and partial discharges are discussed. Diagnostic measurement techniques available and those being developed to determine material degradation affecting available life and failure probability of capacitors are presented
Keywords :
ageing; capacitor storage; failure analysis; life testing; pulsed power technology; aging processes; compact capacitors; diagnostic measurement; dielectric capacitor; electromechanical breakdown; energy-storage pulsed-power capacitor; failure probability; failure process delineation; life testing; material degradation; multifactor stress aging; partial discharges; thermal breakdown; Capacitors; Ceramics; Dielectric constant; Dielectrics and electrical insulation; Java; Permittivity; Senior members; Stress; Switches; Voltage;
Journal_Title :
Power Electronics, IEEE Transactions on
