Title :
Linear diversity analyses for M-PSK in Rician fading channels
Author :
Sun, Jonqyin ; Reed, Irving S.
Author_Institution :
Lucent Technol. ., Whippany, NJ, USA
Abstract :
Symbol and bit error rates of M-ary differentially encoded/differentially decoded phase-shift keying (MDPSK) and coherent M-ary phase-shift keying (M-PSK) over slow, flat, Rician fading channels are derived when linear diversity combining is applied to combat degradation due to fading. These closed-form solutions are general enough to cover several cases of nondiversity, additive white Gaussian noise (the nonfading mode), Rayleigh fading, mixtures of Rayleigh and Rician fading (the mixed mode), and Rician fading. The results presented here can also be applied to predict the error-rate performance when recent transmit diversity techniques are employed. The solutions for the nonuniform fading profile are included as well. Error probabilities are graphically displayed for both modulation schemes.
Keywords :
AWGN channels; Rayleigh channels; Rician channels; differential phase shift keying; diversity reception; error statistics; phase shift keying; AWGN channels; DPSK; M-PSK; M-ary phase-shift keying; Rayleigh fading; Rician fading channels; additive white Gaussian noise; bit error rates; differential phase-shift keying; error probabilities; flat fading channels; linear diversity analysis; linear diversity combining; slow fading channels; symbol error rates; transmit diversity techniques; Additive white noise; Bit error rate; Closed-form solution; Decoding; Degradation; Diversity reception; Error probability; Phase shift keying; Rayleigh channels; Rician channels;
Journal_Title :
Communications, IEEE Transactions on
DOI :
10.1109/TCOMM.2003.819236
