Title :
Dark Current and Signal-to-Noise Ratio in BDJ Image Sensors
Author :
Feruglio, Sylvain ; Hanna, Victor Fouad ; Alquie, Georges ; Vasilescu, Gabriel
Author_Institution :
Lab. des Instruments et Systemes Ile de France, Univ. Pierre et Marie Curie, Paris
Abstract :
In this paper, analytical expressions of dark currents and equivalent noise generators of a CMOS color image sensor are presented, and the signal-to-noise ratio (SNR) at both outputs is evaluated. Static measurements and simulations on Austria Micro Systems 0.35-mum CMOS test structures yield guidelines to increase the SNR of the buried double junction photodetector
Keywords :
CMOS image sensors; integrated circuit noise; photodetectors; 0.35 micron; BDJ image sensors; CMOS color image sensor; CMOS test structures; active pixel sensor; buried double junction photodetector; dark current; equivalent noise generators; signal-to-noise ratio; CMOS image sensors; Dark current; Guidelines; Image analysis; Image color analysis; Image sensors; Noise generators; Signal analysis; Signal to noise ratio; System testing; Active pixel sensor (APS); CMOS; buried double junction (BDJ); dark current; noise; photodetector; signal-to-noise ratio (SNR);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2006.884291
