Title :
Empirical frequency-domain optimal parameter estimate for black-box processes
Author :
Lo, Kueiming ; Kimura, Hidenori ; Kwon, Wook-Hyun ; Yang, Xiaojing
Author_Institution :
Sch. of Software, Tsinghua Univ., Beijing, China
Abstract :
Most of the previous signal processing identification results have been achieved using either time-domain or frequency-domain algorithms. In this study, the two methods were combined to create a novel identification algorithm called the empirical frequency-domain optimal parameter (EFOP) estimate and the recursive EFOP algorithm for common linear stochastic systems disturbed with noise. A general prediction error criterion was introduced in the time-domain estimate. By minimizing the frequency-domain estimate, some general prediction error criteria were constructed for Black-box models. Then, the parameter estimation was obtained by minimizing the general prediction error criterion. This method theoretically provides the globally optimum frequency-domain estimate of the model. It has advantages in anti-disturbance performance, and can precisely identify a model with fewer sample numbers. Lastly, some simulations were carried out to demonstrate the validity of the new method.
Keywords :
frequency-domain analysis; parameter estimation; signal processing; stochastic processes; time-domain analysis; black-box models; black-box processes; common linear stochastic systems; disturbance noise; empirical frequency-domain optimal parameter; frequency-domain algorithms; frequency-domain estimate; general prediction error criterion; parameter estimation; recursive EFOP algorithm; signal processing identification; time-domain algorithms; time-domain estimate; Estimation error; Frequency estimation; Frequency response; Mechanical engineering; Parameter estimation; Predictive models; Signal processing algorithms; System identification; Time domain analysis; Transfer functions; Black-box models; disturbance noise; frequency-domain estimation; general prediction error criterion; time-domain method;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.855737