Title :
Analysis of PLL clock jitter in high-speed serial links
Author :
Hanumolu, Pavan Kumar ; Casper, Bryan ; Mooney, Randy ; Wei, Gu-Yeon ; Moon, Un-Ku
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Abstract :
We analyze the effects of transmitter and receiver phased-locked loop (PLL) phase noise, which translates to time-domain clock/data jitter, on the performance of high-speed transceivers. Analytical expressions are derived to incorporate both transmitter and receiver clock jitter into serial link operation. A method to calculate the worst-case noise margin degradation due to clock jitter is discussed in order to obviate impractical time-domain simulations. This analysis relies on the assumption that the channel is linear and time-invariant and, hence, can be characterized by an impulse response. A simple extension to equalized serial links is also presented. The analysis is verified through behavioral simulations using a realistic/measured channel model.
Keywords :
digital communication; digital phase locked loops; intersymbol interference; phase noise; step response; timing jitter; transceivers; PLL clock jitter; behavioral simulations; eye diagrams; first-order Taylor series approximation; high-speed serial links; high-speed transceivers; impulse response; intersymbol interference; large digital chips; pulse response; receiver phase noise; serial link operation; transmitter phase noise; very high-speed digital systems; worst-case noise margin degradation; Analytical models; Clocks; Degradation; Jitter; Performance analysis; Phase locked loops; Phase noise; Time domain analysis; Transceivers; Transmitters;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
DOI :
10.1109/TCSII.2003.819121