DocumentCode
830811
Title
Enhancement of (In,Ga)N light-emitting diode performance by laser liftoff and transfer from sapphire to silicon
Author
Luo, Z.S. ; Cho, Y. ; Loryuenyong, V. ; Sands, T. ; Cheung, N.W. ; Yoo, M.C.
Author_Institution
Dept. of Mater. Sci. & Eng., California Univ., Berkeley, CA, USA
Volume
14
Issue
10
fYear
2002
Firstpage
1400
Lastpage
1402
Abstract
(In,Ga)N light-emitting diodes (LEDs) fabricated on a sapphire growth substrate were successfully integrated onto Si substrates by a double-transfer technique using excimer laser liftoff and Pd-In transient-liquid-phase bonding. This transfer method resulted in a bonded LED heterostructure with the same orientation (p-side up) as the heterostructure before transfer from the sapphire growth substrate. Such a layer transfer approach enables a top and backside contact metallization scheme that reduces device series resistance, current crowding, and top electrode coverage area. Enhancement of the performance of the transferred LEDs was found in terms of the threshold voltage (at 20 mA) and the electroluminescence output from the front surface.
Keywords
III-V semiconductors; electroluminescence; gallium compounds; indium compounds; integrated circuit bonding; integrated circuit metallisation; integrated optoelectronics; laser materials processing; light emitting diodes; quantum well devices; wide band gap semiconductors; (In,Ga)N light-emitting diode performance enhancement; (InGa)N; 20 mA; Al/sub 2/O/sub 3/; Pd-In transient-liquid-phase bonding; PdIn; Si; Si substrates; backside contact metallization; bonded LED heterostructure; current crowding; device series resistance; double-transfer technique; electroluminescence output; excimer laser liftoff; front surface; heterostructure; layer transfer approach; multiple quantum well LED; p-side up; same orientation; sapphire growth substrate; sapphire to silicon transfer; threshold voltage; top contact metallization; top electrode coverage area; Bonding; Contact resistance; Electrodes; Electroluminescence; Light emitting diodes; Metallization; Proximity effect; Silicon; Surface resistance; Threshold voltage;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2002.802078
Filename
1037530
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