DocumentCode :
83099
Title :
Power Quality Event Classification Under Noisy Conditions Using EMD-Based De-Noising Techniques
Author :
Shukla, Satyavati ; Mishra, Shivakant ; Singh, Bawa
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, New Delhi, India
Volume :
10
Issue :
2
fYear :
2014
fDate :
May-14
Firstpage :
1044
Lastpage :
1054
Abstract :
The paper deals with the application of two empirical mode decomposition (EMD)-based de-noising techniques in power quality assessment. Distinct threshold parameters at a distinct level of decomposition are employed for noise exclusion. Each of the thresholded intrinsic mode functions (IMFs) are then combined together to yield a de-noised version of the signal. For enhanced performance, various noisy versions from the original signal are created and then de-noised using soft thresholds. The resultant de-noised signals are then averaged to obtain the de-noised version of the signal. In other procedures based on EMD, the signal is chopped into smaller portions each having equal length. Each signal portion is then separately subjected to EMD and then de-noised and later combined to obtain noise-free signal. These de-noised signals are then subjected to Hilbert transform for feature extraction. Fuzzy Product Aggregation Reasoning Rule-based intelligent classifier is used here for classification purpose. A comparative study is also made between S-transform-based and wavelet-transform-based de-noising techniques paper. Real-time implementation of the algorithm on a noisy harmonic signal is also given in this paper.
Keywords :
Hilbert transforms; pattern classification; power supply quality; power system harmonics; signal denoising; wavelet transforms; EMD-based denoising techniques; Hilbert transform; IMF; S-transform; empirical mode decomposition; feature extraction; fuzzy product aggregation reasoning rule; intelligent classifier; intrinsic mode functions; noise exclusion; noise-free signal; noisy conditions; noisy harmonic signal; power quality assessment; power quality event classification; resultant denoised signals; threshold parameters; wavelet transform; Feature extraction; Noise; Noise measurement; Noise reduction; Time-frequency analysis; Wavelet transforms; Empirical mode decompositions (EMD); event classification; feature extraction; signal de-noising;
fLanguage :
English
Journal_Title :
Industrial Informatics, IEEE Transactions on
Publisher :
ieee
ISSN :
1551-3203
Type :
jour
DOI :
10.1109/TII.2013.2289392
Filename :
6656869
Link To Document :
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