• DocumentCode
    831154
  • Title

    Threshold current density in strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers

  • Author

    Coleman, James J. ; Beernink, Kevin J. ; Givens, Michael E.

  • Author_Institution
    Microelectron Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    28
  • Issue
    10
  • fYear
    1992
  • fDate
    10/1/1992 12:00:00 AM
  • Firstpage
    1983
  • Lastpage
    1989
  • Abstract
    The authors consider the transparency carrier density in ideal and practical strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers. The transparency carrier density in practical structures is then related to transparency current density using realistic values for spontaneous recombination rates. These parameters are incorporated with representative structural parameters into a nonlinear model for gain in a quantum-well laser, in order to provide a complete model for the laser threshold current density in strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers. These results are then compared and contrasted with experimental laser results from several laboratories
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; semiconductor lasers; III-V semiconductors; laser threshold current density; spontaneous recombination rates; strained layer InxGa1-xAs-GaAs quantum well heterostructure lasers; structural parameters; transparency carrier density; transparency current density; Charge carrier density; Effective mass; Fiber lasers; Laser modes; Laser theory; Pump lasers; Quantum well lasers; Quantum wells; Threshold current; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.159507
  • Filename
    159507