DocumentCode
831154
Title
Threshold current density in strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers
Author
Coleman, James J. ; Beernink, Kevin J. ; Givens, Michael E.
Author_Institution
Microelectron Lab., Illinois Univ., Urbana, IL, USA
Volume
28
Issue
10
fYear
1992
fDate
10/1/1992 12:00:00 AM
Firstpage
1983
Lastpage
1989
Abstract
The authors consider the transparency carrier density in ideal and practical strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers. The transparency carrier density in practical structures is then related to transparency current density using realistic values for spontaneous recombination rates. These parameters are incorporated with representative structural parameters into a nonlinear model for gain in a quantum-well laser, in order to provide a complete model for the laser threshold current density in strained layer InxGa1-xAs-GaAs quantum-well heterostructure lasers. These results are then compared and contrasted with experimental laser results from several laboratories
Keywords
III-V semiconductors; gallium arsenide; indium compounds; semiconductor lasers; III-V semiconductors; laser threshold current density; spontaneous recombination rates; strained layer InxGa1-xAs-GaAs quantum well heterostructure lasers; structural parameters; transparency carrier density; transparency current density; Charge carrier density; Effective mass; Fiber lasers; Laser modes; Laser theory; Pump lasers; Quantum well lasers; Quantum wells; Threshold current; Waveguide lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.159507
Filename
159507
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