Pulse-modulated interferometer for measuring intensity-induced phase shifts

Author

Rochford, K.B. ; Zanoni, Raymond ; Stegeman, George I. ; Krug, W. ; Miao, E. ; Beranek, M.W.

Author_Institution

Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA

Volume

28

Issue

10

fYear

1992

fDate

10/1/1992 12:00:00 AM

Firstpage

2044

Lastpage

2050

Abstract

Single-polarization interferometric measurements of intensity-induced refractive index changes using an intensity-modulated mode-locked laser are reported. The technique is used to determine the electronic and thermal intensity-dependent index changes in a polydiacetylene waveguide. Monte Carlo analysis shows that a sensitivity of at least 0.02 rad is expected from the configuration

Keywords

integrated optics; light interferometers; light interferometry; optical waveguides; polymers; refractive index measurement; Monte Carlo analysis; configuration; electronic intensity dependent index changes; intensity-induced phase shifts; intensity-induced refractive index changes; intensity-modulated mode-locked laser; polydiacetylene waveguide; pulse modulated interferometer; single polarization interferometric measurements; thermal intensity-dependent index changes; Optical interferometry; Optical pulses; Optical refraction; Optical waveguides; Phase measurement; Phase shifting interferometry; Polarization; Probes; Pulse measurements; Refractive index;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.159514

Filename

159514