Title :
Recording performance of discrete track patterned media fabricated by focused ion beam
Author :
Chen, Y.J. ; Ng, K.W. ; Leong, S.H. ; Guo, Z.B. ; Shi, J.Z. ; Liu, B.
Author_Institution :
Data Storage Inst., Singapore, Singapore
fDate :
6/1/2005 12:00:00 AM
Abstract :
We report on the recording performance of discrete track patterned media fabricated by focused ion beam (FIB). We investigated performance over a small area by spinstand read/write testing. Discrete track patterned regions show smaller magnetic track width and better signal separation between adjacent tracks and therefore higher track density than that of nonpatterned continuous media as a result of reduced side fringe effect and edge noise. We found that, at a designed groove depth of 4-8 nm, the shallow FIB etched grooves already provide good isolation between adjacent tracks, indicating the superiority of ion beam induced modification of magnetic properties in film media over physical modification of disk surface topography. This has implications for discrete track recording and media fabrication.
Keywords :
focused ion beam technology; ion beam lithography; magnetic recording; nanopatterning; 4 to 8 nm; discrete track patterned media; discrete track recording; disk surface topography; film media; high track density; ion beam induced modification; magnetic properties; recording performance; shallow FIB etched grooves; spinstand read/write testing; Disk recording; Etching; Ion beams; Magnetic noise; Magnetic properties; Magnetic recording; Magnetic separation; Noise reduction; Source separation; Testing; Discrete track media; FIB lithography; high track density; recording performance;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.847627