Title :
Effects of Total Dose Ionizing, Radiation on the 1802 Microprocessor
Author :
King, E.E. ; Martin, R.L.
Author_Institution :
Naval Research Laboratory Washington, D. C. 20375
Abstract :
Several versions of the 1802 CMOS microprocessor were subjected to Co-60 irradiations. Total dose data is provided for production line parts from two vendors, a specially processed radiation hard lot, and one developmental SOS unit. The increase in total dose failure level from 1 x 104 to 5 x 105 rads(Si) for the specially processed Parts proves the feasibility of hardening the Si-gate LSI technology used for the 1802.
Keywords :
CMOS technology; Clocks; Ionizing radiation; Laboratories; Leakage current; Microprocessors; Production; Radiation hardening; Space technology; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1977.4329186
