• DocumentCode
    831316
  • Title

    Effects of Total Dose Ionizing, Radiation on the 1802 Microprocessor

  • Author

    King, E.E. ; Martin, R.L.

  • Author_Institution
    Naval Research Laboratory Washington, D. C. 20375
  • Volume
    24
  • Issue
    6
  • fYear
    1977
  • Firstpage
    2172
  • Lastpage
    2176
  • Abstract
    Several versions of the 1802 CMOS microprocessor were subjected to Co-60 irradiations. Total dose data is provided for production line parts from two vendors, a specially processed radiation hard lot, and one developmental SOS unit. The increase in total dose failure level from 1 x 104 to 5 x 105 rads(Si) for the specially processed Parts proves the feasibility of hardening the Si-gate LSI technology used for the 1802.
  • Keywords
    CMOS technology; Clocks; Ionizing radiation; Laboratories; Leakage current; Microprocessors; Production; Radiation hardening; Space technology; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1977.4329186
  • Filename
    4329186
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=831316